Publikationen/Vorträge
Inhaltsverzeichnis
Publikationen
-
2012
-
Transition probability functions for applications of inelastic electron scatteringMicron, in print
DOI: 10.1016/j.micron.2012.03.020 -
Elastic propagation of fast electron vortices through crystalsActa Crystallographica A, in print
DOI: 10.1107/S0108767312013189 -
Sub-nanometer free electrons with topological chargeUltramicroscopy 115 (2012) 21 DOI: 10.1016/j.ultramic.2012.01.010
-
-
2011
-
Atomic scale electron vortices for nanoresearchApplied Physics Letters 99 (2011) 203109
DOI: 10.1063/1.3662012 -
Electrons with a twist: Chiral electronic transitions and vortex beams (invited)in: Proceedings of the 10th Multinational Congress on Microscopy, 2011, Urbino
-
Non-Lorentzian scattering behavior in core lossesin: Proceedings of the 10th Multinational Congress on Microscopy, 2011, Urbino
-
Investigating the optical properties of AlxGa1-xAs by low voltage VEELSin: Proceedings of the 10th Multinational Congress on Microscopy, 2011, Urbino
-
Magnetic dichroism in the TEM: a tool for the investigation of magnetism on the nanoscalein: Proceedings of the 10th Multinational Congress on Microscopy, 2011, Urbino
-
Site specific elemental analysis using electron channelingin: Proceedings of the 10th Multinational Congress on Microscopy, 2011, Urbino
-
Advantages of the modified Becke-Johnson exchange potential for calculating EELS in WIEN2kin: Proceedings of the 10th Multinational Congress on Microscopy, 2011, Urbino
-
Propagation of electrons carrying topological chargein: Proceedings of the Microscopy Conference 2011, Kiel, volume 1, DGE – German Society for Electron Microscopy e.V. Germany
ISBN: 978-3-00-033910-3 -
Magnetic dichroism on the nanoscalein: Proceedings of the Microscopy Conference 2011, Kiel, volume 1, DGE – German Society for Electron Microscopy e.V. Germany
ISBN: 978-3-00-033910-3 -
Low voltage low loss EELS for accurate determination of dielectric properties of semiconductorsin: Proceedings of the Microscopy Conference 2011, Kiel, volume 1, DGE – German Society for Electron Microscopy e.V. Germany
ISBN: 978-3-00-033910-3 -
Towards orbital mapping in the TEM — Non-Lorentzian angular dependence in core lossesin: Proceedings of the Microscopy Conference 2011, Kiel, volume 1, DGE – German Society for Electron Microscopy e.V. Germany
ISBN: 978-3-00-033910-3 -
Site selective elemental analysis under electron channelling conditionsin: Proceedings of the Microscopy Conference 2011, Kiel, volume 1, DGE – German Society for Electron Microscopy e.V. Germany
ISBN: 978-3-00-033910-3 -
Advantages of the modified Becke-Johnson Potential in WIEN2k for NiO demonstrated by EELSin: Proceedings of the Microscopy Conference 2011, Kiel, volume 1, DGE – German Society for Electron Microscopy e.V. Germany
ISBN: 978-3-00-033910-3 -
Sub-5 meV precision in plasmon mappingin: Proceedings of the Microscopy Conference 2011, Kiel, volume 1, DGE – German Society for Electron Microscopy e.V. Germany
ISBN: 978-3-00-033910-3 -
TeXworks — As you like itTUGboat, 32:2 (2011) 133
-
Breakdown of the Dipole Approximation in Core LossesUltramicroscopy, 111 (2011) 1163-1167
DOI: 10.1016/j.ultramic.2011.03.006 -
Capturing EELS in the reciprocal spaceEuropean Physical Journal - Applied Physics, 54 (2011) 33510
DOI: 10.1051/epjap/2011100469 -
Impact of Growth Temperature on the Crystal Habits, Forms and Structures of VO2 NanocrystalsApplied Physics A 102 (2011) 201-204
DOI: 10.1007/s00339-010-5940-5
-
-
2010
-
Circular Dichroism in the Electron Microscope: Progress and ApplicationsJournal of Applied Physics 107 (2010) 09D311
DOI: 10.1063/1.3365517 -
A software package for the simulation of energy-loss magnetic chiral dichroismUltramicroscopy 110 (2010) 831-835
DOI: 10.1016/j.ultramic.2010.02.044 -
Energy-Loss Magnetic Chiral Dichroism - Investigating Magnetism on the Nanometer Scalein: Proceedings of the Junior Scientist Conference, 2010, Vienna University of Technology
ISBN: 978-3-200-01797-9
-
-
2009
-
Synthesis, Analysis and Device Integration of Vanadium-Dioxide Nanowiresmeine Diplomarbeit; sh. Universitätsbibliothek der TU Wien
-
Ultrafast VLS growth of epitaxial β-Ga2O3 nanowiresNanotechnology 20 (2009) 434017
DOI: 10.1088/0957-4484/20/43/434017 -
In situ TEM measurements to study structural changes of VO2 nanowiresin: Microscopy Conference, Graz, Austria, Volume 3: Materials Science, 2009, TU Graz
ISBN: 978-3-85125-062-6; DOI: 10.3217/978-3-85125-062-6-641
-
Vorträge
-
2012
-
Electron vortex beams: a novel probe for nano-analysisVortrag beim 2nd ASEM Workshop on Advanced Electron Microscopy in Salzburg, Österreich (26.04.2012 - 27.04.2012)
-
Numerical simulations of classical 200 keV electrons passing atomic magnetostatic dipolesVortrag beim 2nd ASEM Workshop on Advanced Electron Microscopy in Salzburg, Österreich (26.04.2012 - 27.04.2012)
-
Simulations of energy loss spectra: Advances and future prospectsVortrag beim 2nd ASEM Workshop on Advanced Electron Microscopy in Salzburg, Österreich (26.04.2012 - 27.04.2012)
-
Simulating HR-EFTEM imagesVortrag beim 2nd ASEM Workshop on Advanced Electron Microscopy in Salzburg, Österreich (26.04.2012 - 27.04.2012)
-
-
2011
-
Magnetic dichroism on the nanoscale (eingeladen)Vortrag beim 3rd ANKA/KNMF Joint Users' Meeting in Karlsruhe, Deutschland (13.10.2011 - 14.10.2011)
-
Magnetic dichroism in the TEM: a tool for the investigation of magnetism on the nanoscaleVortrag beim 10th Multinational Congress on Microscopy in Urbino, Italien (04.09.2011 - 09.09.2011)
-
Electrons with a twist: Chiral electronic transitions and vortex beams (eingeladen)Vortrag beim 10th Multinational Congress on Microscopy in Urbino, Italien (04.09.2011 - 09.09.2011)
-
Propagation of electrons carrying topological chargeVortrag bei der Microscopy Conference 2011 in Kiel, Deutschland (28.08.2011 - 02.09.2011)
-
Non‐Lorentzian Scattering Behavior in Core‐Losses — A Glimpse of Wave FunctionsVortrag beim 1. ASEM Workshop on Advanced Electron Microscopy in Graz, Österreich (07.04.2011 - 08.04.2011)
-
Site selective analysis under electron channelling conditionsVortrag beim 1. ASEM Workshop on Advanced Electron Microscopy in Graz, Österreich (07.04.2011 - 08.04.2011)
-
-
2010
-
Non-Lorentzian Scattering Behavior in Core-Losses — a Glimpse of Wave FunctionsVortrag beim 7. Workshop on EELS & EFTEM in Zürich, Schweiz (27.10.2010 - 29.10.2010)
-
Highlights and Applications of Energy Loss Magnetic Chiral DichroismVortrag beim 7. Workshop on EELS & EFTEM in Zürich, Schweiz (27.10.2010 - 29.10.2010)
-
Site Selective Analysis Using Electron ChannelingVortrag beim 7. Workshop on EELS & EFTEM in Zürich, Schweiz (27.10.2010 - 29.10.2010)
-
Energy-Loss Magnetic Chiral Dichroism - Investigating Magnetism on the Nanometer ScaleVortrag bei der Junior Scientist Conference 2010 in Wien, Österreich (04.04.2010 - 09.04.2010)
-
-
2008
-
Epitaxial Catalyst-free Growth and Characterization of Nanowires of Strongly Correlated VO2 Exhibiting a MIT TransitionVortrag beim MRS Fall Meeting 2008 in Boston, USA (01.12.2008 - 05.12.2008)
-
Influence of Oxygen and Temperature on β-Ga2O3 Nanowire SynthesisVortrag beim 2nd International Symposium on Transparent Conductive Oxides, Kreta, Griechenland (22.10.2008 - 26.10.2008)
-
Poster
-
2011
-
Advantages of the modified Becke-Johnson exchange potential for calculating EELS in WIEN2kPoster beim 10th Multinational Congress on Microscopy in Urbino, Italien (04.09.2011 - 09.09.2011)
-
Non-Lorentzian scattering behavior in core lossesPoster beim 10th Multinational Congress on Microscopy in Urbino, Italien (04.09.2011 - 09.09.2011)
-
Site specific elemental analysis using electron channellingPoster beim 10th Multinational Congress on Microscopy in Urbino, Italien (04.09.2011 - 09.09.2011)
-
Investigating the optical properties of AlxGa1-xAs by low voltage VEELSPoster beim 10th Multinational Congress on Microscopy in Urbino, Italien (04.09.2011 - 09.09.2011)
-
Magnetic dichroism on the nanoscalePoster bei der Microscopy Conference 2011 in Kiel, Deutschland (28.08.2011 - 02.09.2011)
-
Low voltage low loss EELS for accurate determination of dielectric properties of semiconductorsPoster bei der Microscopy Conference 2011 in Kiel, Deutschland (28.08.2011 - 02.09.2011)
-
Towards orbital mapping in the TEM — Non-Lorentzian angular dependence in core lossesPoster bei der Microscopy Conference 2011 in Kiel, Deutschland (28.08.2011 - 02.09.2011)
-
Site selective elemental analysis under electron channelling conditionsPoster bei der Microscopy Conference 2011 in Kiel, Deutschland (28.08.2011 - 02.09.2011)
-
Advantages of the modified Becke-Johnson Potential in WIEN2k for NiO demonstrated by EELSPoster bei der Microscopy Conference 2011 in Kiel, Deutschland (28.08.2011 - 02.09.2011)
-
Sub-5 meV precision in plasmon mappingPoster bei der Microscopy Conference 2011 in Kiel, Deutschland (28.08.2011 - 02.09.2011)
-
Low voltage low loss EELS for determination of optical properties of semiconductorsPoster bei der 16. Tagung Festkörperanalytik in Wien, Österreich (04.07.2011 - 06.07.2011)
-
Energy-Loss Magnetic Chiral Dichroism - Investigating Magnetism on the Nanometer ScalePoster bei der 16. Tagung Festkörperanalytik in Wien, Österreich (04.07.2011 - 06.07.2011)
-
-
2010
-
Energy Loss Magnetic Chiral Dichroism: A Tool for the Investigation of Magnetism on the NanoscalePoster bei der Materials Science and Engineering MSE 2010 in Frankfurt, Deutschland (24.08.2010 - 26.08.2010)
-
Energy-Loss Magnetic Chiral Dichroism - Investigating Magnetism on the Nanometer ScalePoster bei der Junior Scientist Conference 2010 in Wien, Österreich (04.04.2010 - 09.04.2010)
-
-
2009
-
In situ TEM measurements to study structural changes of VO2 nanowiresPoster bei der Microscopy Conference 2009 in Graz, Österreich (30.08.2009 - 4.09.2009)
-